Browsing by Author Mestanza S.N.M.

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Showing results 1 to 9 of 9
PreviewIssue DateTitleAuthor(s)AdvisorType
2014Effect Of Annealing Time On Memory Behavior Of Mos Structures Based On Ge NanoparticlesMederos M.; Mestanza S.N.M.; Doi I.; Diniz J.A.-Artigo de evento
2006Characterization And Modeling Of Antireflective Coatings Of Si O 2, Si3 N4, And Si Ox Ny Deposited By Electron Cyclotron Resonance Enhanced Plasma Chemical Vapor DepositionMestanza S.N.M.; Obrador M.P.; Rodriguez E.; Biasotto C.; Doi I.; Diniz J.A.; Swart J.W.-Artigo de periódico
2004High Performance Active Pixel Sensors Fabricated In A Standard 2.0 μm Cmos TechnologyMestanza S.N.M.; Jimenez H.G.; IFSilva; Diniz J.A.; Doi I.; Swart J.W.-Artigo de evento
2004High Sensitivity Obtained By Three-color Detector Aps-cmos Using Antireflective CoatingMestanza S.N.M.; Biasotto C.; Costa A.C.; Dias G.O.; Doi I.; Diniz J.A.; Swart J.W.-Artigo de evento
2013Structural And Electrical Properties Of Ge Nanoparticles Grown By Lpcvd For MosstructuresMederos M.; Mestanza S.N.M.; Doi I.; Diniz J.A.-Artigo de evento
1999Laser Reflectometry Applied To The In-situ Etching Control In An Electron Cyclotron Resonance Plasma SystemMestanza S.N.M.; Diniz J.A.; Frateschi N.C.-Artigo de evento
1999Ingaas/gaas/ingap Quantum Well Laser With Etched Mirrors Obtained By Electron Cyclotron Resonance PlasmaMestanza S.N.M.; Von Zuben A.A.; Frateschi N.C.; Bettini J.; de Carvalho M.M.G.-Artigo de evento
2005Characterization And Performance Evaluation Of A Aps Pixel In A Standard 2μm Cmos TechnologyMestanza S.N.M.; Rodriguez E.; Jimenez H.G.; Diniz J.A.; Doi I.; Swart J.W.-Artigo de evento
2005Growth And Characterization Of Silicon Nanocrystals Obtained By Ion ImplantationDias G.O.; Mestanza S.N.M.; Queiroz J.E.C.; Marins E.S.V.P.; Doi I.; Rodriguez E.; Tejero D.C.B.-Artigo de evento