Browsing by Author Teschke O.

Jump to: 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z

or enter first few letters:  
Showing results 1 to 20 of 46  next >
PreviewIssue DateTitleAuthor(s)AdvisorType
1995On Surface Plasmons In Porous Silicon: Measurements Of The Electron Energy Loss In Etched Silicon NanocrystalsSassaki R.M.; Galembeck F.; Teschke O.-Artigo de periódico
1995Visualization Of Nanostructured Porous Silicon By A Combination Of Transmission Electron Microscopy And Atomic Force MicroscopyTeschke O.-Artigo de periódico
1996Isolated Submicrometer Filaments Formed By Silicon Anodization In Hf SolutionsTeschke O.; Scares D.M.-Artigo de periódico
1996Surface Morphologies Of Be-doped Homoepitaxial Inp FilmsCotta M.A.; De Carvalho M.M.G.; Pudenzi M.A.A.; Landers K.M.I.; De Souza C.F.; Martins R.B.; Landers R.; Teschke O.-Artigo de periódico
2001Ionic Surfactant Films Imaged By Atomic Force MicroscopyCeotto G.; De Souza E.F.; Teschke O.-Artigo de evento
1996Dynamics Of The Hydrogen Oxidation And Silicon Dissolution Reactions In The Formation Of Porous SiliconSoares D.M.; Teschke O.; Dos Santos M.C.-Artigo de periódico
2001Rupture Force Of Adsorbed Self-assembled Surfactant Layers: Effect Of The Dielectric Exchange ForceTeschke O.; Ceotto G.; De Souza E.F.-Artigo de periódico
1995Anodically Grown Porous Silicon Structure: Formation MechanismsSoares D.M.; dos Santos M.C.; Teschke O.-Artigo de periódico
1995Spatially Variable Reaction In The Formation Of Anodically Grown Porous Silicon StructuresTeschke O.; Dos Santos M.C.; Kleinke M.U.; Soares D.M.; Galvao D.S.-Artigo de periódico
1994Spatial Distribution Of Oxygen In Luminescent Porous Silicon FilmsTeschke O.-Artigo de periódico
2007Line Tension At High Contact Angle Wetting: Contribution To Interfacial Energy At Long Distances (≫100 Å) From The Triple Line ContourTeschke O.; de Souza E.F.-Artigo de periódico
2007Imaging And Characterization Of Self-assembled Soft Nanostructures By Atomic Force MicroscopyDe Souza E.F.; Teschke O.-Artigo de evento
1997Atomic Force Microscopic Imaging In Liquids: Effects Of The Film Compressed Between The Substrate And The TipDe Souza E.F.; Douglas R.A.; Teschke O.-Artigo de periódico
1993Stability Criteria For Buckling Of Thin Anodic Films On AluminumTeschke O.; Kleinke M.U.-Artigo de periódico
1993Etching Technique For Transmission Electron Microscopy Observation Of Nanostructure Of Visible Luminescent Porous SiliconTeschke O.; Goncalves M.C.; Galembeck F.-Artigo de periódico
1993Time Resolved Photoluminescence Of Porous Silicon: Evidence For Tunneling Limited Recombination In A Band Of Localized StatesTessler L.R.; Alvarez F.; Teschke O.-Artigo de periódico
1993Buckling Of Anodic Films On AluminumTeschke O.; Kleinke M.U.; Galembeck F.-Artigo de periódico
1990Pattern Formation On Iron Electrodes In Sulfuric Acid SolutionsTeschke O.; Kleinke M.U.; Galembeck F.; Tenan M.A.-Artigo de periódico
1983Porous Ptfe Separator For High Temperature Water ElectrolyzersTeschke O.; Costa A.C.; Galembeck F.-Artigo de periódico
1990Measurements Of Electrode Polarization Applied To Full-size Electrolyser Equipment By Means Of Frontal Luggin CapillariesBonugli L.O.; Teschke O.-Artigo de periódico