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Type: Artigo de periódico
Title: Dielectric exchange-force effect on the rupture force of adsorbed bilayers of self-assembled surfactant films
Author: Teschke, O
Ceotto, G
de Souza, EF
Abstract: We measured and formulated dielectric exchange forces between adsorbed layers of self-assembled surfactant films and atomic-force microscope tips in water. The dielectric exchange-force model is in agreement with the observation that the surfactant-layer rupture forces (tip-applied force necessary to obtain tip/substrate contact) are smaller in the thickest layers, where the compactness of the adsorbed film results in the smallest values of the dielectric permittivity. Within experimental accuracy, a dielectric permittivity value of similar to4 for bilayers and of similar to 36 for monolayers is found. (C) 2001 American Institute of Physics.
Country: EUA
Editor: Amer Inst Physics
Citation: Applied Physics Letters. Amer Inst Physics, v. 78, n. 20, n. 3064, n. 3066, 2001.
Rights: aberto
Identifier DOI: 10.1063/1.1358369
Date Issue: 2001
Appears in Collections:Unicamp - Artigos e Outros Documentos

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